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ETA-SST

Reflectance and thickness measurement systems for laboratory applications

ETA-SST is a system for measurement of spectral reflectance and layer thickness. Its small size and easy-to-use operating software make this system an excellent choice for laboratory applications and small-scale quality control procedures.

ETA SST


ETA SST System Configuration


Application examples

Reflectance measuring screen shot
REFLECTANCE
• Reflection measurement of antireflective (AR) coatings for the glass industry
• Reflection measurement of bare glass for manufacturers of precision optics


Single-Layer Thickness measuring screen shot
SINGLE-LAYER THICKNESS
• Thickness measurement of materials for semiconductor applications
• Thickness measurement of paint and photo-resist materials


Dual-Layer Thickness measuring screen shot
DUAL-LAYER THICKNESS
• Thickness measurement of primer + hardcoat for automotive applications
• Thickness measurement of plastic stacks for packaging applications

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For more information, please contact thinfilm@audiodev.com

pdf-symbol System specifications
AudioDev Sweden AB: Derbyvägen 4, SE-212 35 Malmö, Sweden, Tel: +46 40 690 49 00, Org no. 556765-1129
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