Solar Cells

In-line and offline measurement of silicon nitride-based solar cells

Silicon Nitride plays an important role in the manufacturing process of wafer-based solar cells. Measurement of its layer properties is often expensive and time-consuming.

By using industry-proven spectrometer technology and proprietary algorithms, AudioDev’s range of ETA testers for the solar business can help you optimize your production process in regards to silicon.nitride coatings on wafer-based solar cells. The new Helios-range measures the layer thickness, color and refractive index of the Silicon Nitride layer.

AudioDev have purpose-designed measurement equipment for measuring the key- and critical characteristics of silicon nitride-layer on wafer-based solar cells, both in-line and offline.

AudioDev offers the Helios SCAN-tc, an offline measurement system designed for the measuring of the coating of solar cells, in particular the thickness and color of the silicon nitride coating – all of which are needed to optimize processes at lowest cost and shortest line downtime. For detailed information about the Helios SCAN-tc, please refer to the products pages on the left side.

The Helios INLINE-tn is an in-line measurement system for layer thickness as well as refractive index of the silicon nitride layer. The system is designed and optimized for inline use and can be retrofitted in existing production lines. For detailed information about the Helios INLINE-tn, please refer to the products pages on the left side.

The AudioDev Helios SCAN-tc offline tester